Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

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Development of a novel nanoindentation technique by utilizing a dual-probe AFM system

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ژورنال

عنوان ژورنال: Beilstein Journal of Nanotechnology

سال: 2015

ISSN: 2190-4286

DOI: 10.3762/bjnano.6.205