Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
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چکیده
منابع مشابه
Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
A novel instrumentation approach to nanoindentation is described that exhibits improved resolution and depth sensing. The approach is based on a multi-probe scanning probe microscopy (SPM) tool that utilizes tuning-fork based probes for both indentation and depth sensing. Unlike nanoindentation experiments performed with conventional AFM systems using beam-bounce technology, this technique inco...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2015
ISSN: 2190-4286
DOI: 10.3762/bjnano.6.205